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From Pamela Pena Martin
| 24 24 playsNovember 2, 2021 Presenter: Dr. Andrey Krayev, North America AFM-Raman manager for Horiba Scientific Note: If you'd like to use this tool at MRL, you can find more… -
From Kathy Walsh
Dr. Honghui Zhou, MRL This webinar focuses on advanced SEM imaging with instrument functions that are available at MRL but may not be well known to our SEM users.… -
From Kathy Walsh
Dr. Roddel Remy, Research Scientist, MRL While a plethora of techniques can be used to characterize soft materials, some methods are more commonly associated with the… -
From Kathy Walsh
Basics of Atomic Force MicroscopyDr. Kathy Walsh, Senior Research Scientist, Illinois Materials Research Laboratory Atomic force microscopy is a versatile technique for…